What is Defect Analysis?

Defect analysis refers to the structured identification and classification of defects within a volume dataset. The method delivers actionable quality data for product release, process optimisation and root-cause analysis.

Scientific background

Methodologically, the procedure relies on standardised workflows covering data acquisition, segmentation, feature extraction and evaluation. Core elements include morphological defect features and zone-based severity grades. Meaningful results only emerge from traceable criteria and defined acceptance limits.

Relevant key metrics

Detection limit and misclassification risk for the relevant failure modes.
Repeatability of the evaluation for identical input data.
Relationship between indicators and functional load zones / specifications.

Standards and thresholds

Standards: ISO 15708-3:2025 and ISO 15708-4:2025 (operation, interpretation, qualification).
Typical thresholds (in practice): Minimum defect size for reliable detection usually at least 3 voxels; critical zones use stricter limits than non-critical areas.
Validity: Limits are part- and function-specific; universal defaults do not exist.

Application in industrial practice

Data-based release decisions during ramp-up and series production.
Early detection of deviations with cause-oriented prioritisation.
Improved customer and supplier communication through objective CT reports.

Sources and reference date

ISO 15708-3:2025 (Operation/Interpretation).
ISO 15708-4:2025 (Qualification).
Reference date: February 2026.