What are CT Artifacts?

CT artifacts are imaging disturbances that do not correspond to the real component geometry. The topic is a methodological foundation for reliable CT data, because it directly affects detection limits, measurement capability and reproducibility.

Scientific background

The scientific basis is rooted in the physical interaction of X-ray radiation with matter and in the mathematical data processing of projections. Particularly relevant are spectral effects, scattered radiation, motion and detector artifacts. For technical decisions, these relationships must be understood as a quantifiable measurement chain.

Relevant key metrics

Spatial resolution, contrast-to-noise ratio and measurement uncertainty are the central parameters.
Systematic effects are controlled via calibration, reference standards and repeat measurements.
Parameter changes must be evaluated for robustness and transferability to series production conditions.

Standards and thresholds

Standards: ISO 15708-2:2025, ISO 15708-3:2025 and ISO 15708-4:2025 (industrial CT).
Typical thresholds (in practice): Detectable defect d_min typically at least 3 × voxel size; artifact-induced false indications in reference zones = 0 for release.
Validity: Artifact limits are part-, material- and parameter-dependent and must be qualified per application.

Application in industrial practice

Design of valid scan parameters for defect and measurement tasks.
Objective interpretation of CT findings in development and series production.
Comparability of results across systems, batches and time points.

Sources and reference date

ISO 15708-2:2025 (Principles, equipment and samples).
ISO 15708-3:2025 (Operation and interpretation).
ISO 15708-4:2025 (Qualification).
Reference date: February 2026.